Andino USV: Without Batteries
A maintenance free uninterruptible power supply with long life expetancy
The Andino UPS is an uninterruptible power supply that bridges short-term voltage dips. The goal is to allow a controlled shutdown of controls to prevent data loss. This allows, for example, databases and applications to be closed or file systems synchronized. By dispensing with batteries, the Andino UPS 100% maintenance-free – and that for years. UPSs based on lead batteries show their unreliability, especially in the case of cases. Andino UPS guarantees its performance even after many years of running time. Andino UPS operates with 24 volts at the input and output. Thus, lossy converters are unnecessary.
- Allows the controlled shutdown of industrial controls and single board computers such as the Andino X1, Raspberry Pi.
- Operates with 24 V as input and output voltage.
- Mounting in control cabinet on DIN rail.
- No external batteries required.
- Power Fail Signal. As TTL and falling relay.
- Internal status readable via I2C
The Andino UPS has a 24V DC voltage input with reverse polarity protection. The integrated EMC protection circuits protect the following hardware from voltage surges and current surges on the supply line. A buffer power of 10W is available for 40 seconds, sufficient time for a controlled shutdown.
Andino UPS supports all compact computers with an input voltage of 24 V.
In the event of a voltage drop, the Andino UPS outputs a galvanically isolated signal. This can be used to control any actions that are necessary before the shutdown. Conventional cheap UPS offer only a USB interface.
The internal state of the UPS can be queried via i2c.
- Charging status of the memories
- Current measured capacity of memory
- Current Voltage at the memories
- ..and more.
Designed, developed and manufactured in Germany.
The Andino UPS has been extensively tested for its electromagnetic compatibility (EMC).
The tests were based on the immunity to electrostatic discharge, high-frequency electromagnetic fields, fast transient electrical disturbances (burst), impulse voltages, conducted disturbances – induced by high-frequency fields and magnetic fields with energy-related frequencies.
The tested standards in detail
Radiated field strength / conducted emissions
DIN EN 55022: 2011 according to VDE 0875 part 22 of 12.2011
Störaussendung: Klasse B (Wohnbereich) (strengere Grenzwerte)
Störfestigkeit: Klasse A (Industriebereich) herangezogen. (höhere Einstrahlung)
DIN EN 61000-4-2: 2009 according to VDE 0847 part 4-2 of 12.2009
Immunity radiated electromagnetic fields
DIN EN 61000-4-3: 2006+A1:2008+ A2: 2010 according to VDE 0847 part 4-3 of 04.2011
DIN EN 61000-4-4: 2012 according to VDE 0847 part 4-4 of 04.2013
DIN EN 61000-4-5: 1995 +A1: 2014 according to VDE 0847 part 4-5 of 03.2015
Immunity high frequent uncoupled emission
DIN EN 61000-4-6: 2014 according to VDE 0847 part 4-6 of 08.2014
Immunity magnetic fields
DIN EN 61000-4-8: 2010 according to VDE 0847 part 4-8 of 11.2010
The life expectancy of the used memory is strongly dependent on the ambient temperature. At 43 degrees, the memory loses 30% of its capacity after about 7 years.